ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,817, issued on Nov. 3, was assigned to THE AEROSPACE Corp. (El Segundo, Calif.). "Patterned dark mirror coatings for multi-functional optics... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,818, issued on Nov. 3, was assigned to ASML NETHERLANDS (Veldhoven, Netherlands). "Interface definition for lithographic apparatus" was inve... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,820, issued on Nov. 3, was assigned to LG CHEM Ltd. (Seoul, South Korea). "Stripper composition for removing photoresist and stripping metho... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,822, issued on Nov. 3, was assigned to ASML NETHERLANDS (Veldhoven, Netherlands). "Method for determining mask pattern and training machine ... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,824, issued on Nov. 3, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "Method for simulating illumination and imaging properties... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,825, issued on Nov. 3, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands). "Diffraction-based pupil determination for optimizati... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,826, issued on Nov. 3, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "Measurement apparatus, method for operating a mask-metrol... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,827, issued on Nov. 3, was assigned to ASML NETHERLANDS (Veldhoven, Netherlands). "Lithographic method" was invented by Pioter Nikolski (Vel... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,828, issued on Nov. 3, was assigned to KLA Corp. (Milpitas, Calif.). "System and method for target centering detection in overlay metrology"... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,829, issued on Nov. 3, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands). "Overlay metrology based on template matching with ad... और पढ़ें