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US Patent Issued to HITACHI HIGH-TECH on Sept. 15 for "Charged particle beam device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,448, issued on Sept. 15, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Charged particle beam device" was invented by Hirohisa Enomoto ... Read More


US Patent Issued to YEDA RESEARCH AND DEVELOPMENT on Sept. 15 for "Laser-based contrast control in transmission electron microscopy" (Israeli Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,449, issued on Sept. 15, was assigned to YEDA RESEARCH AND DEVELOPMENT Co. LTD. (Rehovot, Israel). "Laser-based contrast control in transm... Read More


US Patent Issued to Inspiring Atoms on Sept. 15 for "Control system and method for ion energy distribution in plasma process chambers using tailored waveform generators" (Singaporean Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,450, issued on Sept. 15, was assigned to Inspiring Atoms Pte Ltd (Singapore). "Control system and method for ion energy distribution in pl... Read More


US Patent Issued to Hitachi High-Tech on Sept. 15 for "Charged particle beam apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,451, issued on Sept. 15, was assigned to Hitachi High-Tech Corp. (Tokyo). "Charged particle beam apparatus" was invented by Hideki Tsushim... Read More


US Patent Issued to Carl Zeiss Microscopy on Sept. 15 for "Method for operating a particle beam microscope" (German Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,452, issued on Sept. 15, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany). "Method for operating a particle beam microscope" was... Read More


US Patent Issued to IMS Nanofabrication on Sept. 15 for "Method for determining focal properties in a target beam field of a multi-beam charged-particle processing apparatus" (Austrian Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,453, issued on Sept. 15, was assigned to IMS Nanofabrication GmbH (Brunn am Gebirge, Austria). "Method for determining focal properties in... Read More


US Patent Issued to SAMSUNG ELECTRONICS on Sept. 15 for "Substrate processing apparatus" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,454, issued on Sept. 15, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Substrate processing apparatus" was invent... Read More


US Patent Issued to Applied Materials on Sept. 15 for "RF power splitting and control" (New York, California Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,455, issued on Sept. 15, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "RF power splitting and control" was invented by Da... Read More


US Patent Issued to FEI on Sept. 15 for "Multiple input split ring resonator ion beam source" (Oregon Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,456, issued on Sept. 15, was assigned to FEI Co. (Hillsboro, Ore.). "Multiple input split ring resonator ion beam source" was invented by ... Read More


US Patent Issued to Applied Materials on Sept. 15 for "Remote plasma apparatus for generating high-power density microwave plasma" (California Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,457, issued on Sept. 15, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Remote plasma apparatus for generating high-power ... Read More