US Patent Issued to Carl Zeiss Microscopy on Sept. 15 for "Method for operating a particle beam microscope" (German Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,452, issued on Sept. 15, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany).

"Method for operating a particle beam microscope" was invented by Bjoern Gamm (Koenigsbronn, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a method for operating a particle beam microscope, an image of an object region is generated by virtue of a particle beam being directed to a multiplicity of incidence locations within the object region. Particles are detected and a data record is generated. The data record represents the image by a field of pixels, with a position of the pixel in the field representing the incidence location and a pixel value of the...