ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,174, issued on Nov. 3, was assigned to Caterpillar Inc. (Peoria, Ill.). "Monitoring integrity of charging rail system" was invented by Micha... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,175, issued on Nov. 3, was assigned to NATIONAL CHENG KUNG UNIVERSITY (Tainan City, Taiwan). "Gas dispersion plate inspection method, its el... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,176, issued on Nov. 3, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Registration between an inspection image and a desi... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,177, issued on Nov. 3, was assigned to MITSUBISHI HEAVY INDUSTRIES MACHINERY SYSTEMS LTD. (Kobe, Japan). "Device and method for detecting de... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,178, issued on Nov. 3, was assigned to Carl Zeiss MultiSEM GmbH (Oberkochen, Germany). "Method for defect detection in a semiconductor sampl... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,179, issued on Nov. 3, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Unsupervised method to increase signal-to-noise-rat... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,180, issued on Nov. 3, was assigned to SIEMENS Healthineers AG (Erlangen, Germany). "Method for assessing a component quality of an electron... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,181, issued on Nov. 3, was assigned to SK ON Co. LTD. (Seoul, South Korea). "Master jig and equipment diagnosis method using the same" was i... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,182, issued on Nov. 3, was assigned to United Semiconductor (Xiamen) Co. Ltd. (Xiamen, China). "Method for detecting defects of a semiconduc... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,183, issued on Nov. 3, was assigned to RICOH COMPANY LTD. (Tokyo). "Inspection apparatus, inspection method, and nontransitory recording med... Read More