ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,180, issued on Nov. 3, was assigned to SIEMENS Healthineers AG (Erlangen, Germany).
"Method for assessing a component quality of an electron emitter" was invented by Malte Tschentscher (Bamberg, Germany), Andreas Selmaier (Erlangen, Germany), Brian Da Silva Teixeira (Princeton, N.J.), Ankur Kapoor (Plainsboro, N.J.), Vivek Singh (Princeton, N.J.), Florian Holch (Nuremberg, Germany), Patrick Luehring (Hoechstadt, Germany) and Michael Wiessner (Wiesentheid, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "One or more example embodiments of the present invention relates to a computer-implemented method for assessing a component quality of an elect...