US Patent Issued to RICOH on Nov. 3 for "Inspection apparatus, inspection method, and nontransitory recording medium" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,183, issued on Nov. 3, was assigned to RICOH COMPANY LTD. (Tokyo).

"Inspection apparatus, inspection method, and nontransitory recording medium" was invented by Satoshi Suzuki (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus includes a reading device to read a printed medium on which a form is printed in advance to generate first image data, a printed matter being the printed medium on which an image is printed by a printing apparatus based on print data to generate second image data, and circuitry. The circuitry is to generate a difference image between the second image data and a master image, the master image...