ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,983, issued on June 9, was assigned to Ichor Systems Inc.. "Fluid delivery module" was invented by Philip Ryan Barros (Pleasanton, Calif.), ... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,984, issued on June 9, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Control of environment within process... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,985, issued on June 9, was assigned to Semes Co. LTD. (Cheonan-si, South Korea). "Apparatus for treating substrate" was invented by Mi So Pa... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,986, issued on June 9, was assigned to SEMES Co. LTD. (Cheonan-si, South Korea). "Substrate processing apparatus and substrate processing me... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,987, issued on June 9, was assigned to Semes Co. LTD. (Cheonan-si, South Korea). "Apparatus for treating substrate and method for treating a... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,988, issued on June 9, was assigned to Momentum Optics (Longmont, Colo.). "Thermally guided chemical etching of a substrate and real-time mo... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,989, issued on June 9, was assigned to SEMES Co. LTD. (Cheonan-si, South Korea). "Supporting unit and substrate treating apparatus including... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,990, issued on June 9, was assigned to SAFRAN CERAMICS (Le Haillan, France). "Apparatus comprising a removable tool for infiltration in the ... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,991, issued on June 9, was assigned to ASM IP Holding B.V. (Almere, Netherlands). "Semiconductor processing apparatus" was invented by JaeMi... Read More
ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,992, issued on June 9, was assigned to Lam Research Corp. (Fremont, Calif.). "Systems and techniques for optical measurement of thin films" ... Read More