US Patent Issued to ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH on May 12 for "Aberration corrector, a charged particle beam apparatus, a method of aligning an aberration corrector and a method of correcting aberration of a charged particle beam" (German Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,881, issued on May 12, was assigned to ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH (Heimstetten, Germany). "Ab... Read More

US Patent Issued to FEI on May 12 for "Sample carrier for use in a charged particle microscope, and a method of using such a sample carrier in a charged particle microscope" (Czech Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,882, issued on May 12, was assigned to FEI Co. (Hillsboro, Ore.). "Sample carrier for use in a charged particle microscope, and a method of ... Read More

US Patent Issued to FEI on May 12 for "Apparatus and method for manipulating a microscopic sample" (Oregon Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,883, issued on May 12, was assigned to FEI Co. (Hilllsboro, Ore.). "Apparatus and method for manipulating a microscopic sample" was invented... Read More

US Patent Issued to FEI on May 12 for "Method and scanning transmission charged-particle microscope" (Dutch Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,884, issued on May 12, was assigned to FEI COMPANY (Hillsboro, Ore.). "Method and scanning transmission charged-particle microscope" was inv... Read More

US Patent Issued to Axcelis Technologies on May 12 for "Wire or rod shaped extraction electrode optics" (Massachusetts, New Hampshire Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,885, issued on May 12, was assigned to Axcelis Technologies Inc. (Beverly, Mass.). "Wire or rod shaped extraction electrode optics" was inve... Read More

US Patent Issued to Lam Research on May 12 for "Systems and methods for radiofrequency signal generator-based control of impedance matching system" (New York, California Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,887, issued on May 12, was assigned to Lam Research Corp. (Fremont, Calif.). "Systems and methods for radiofrequency signal generator-based ... Read More

US Patent Issued to NISSIN ION EQUIPMENT on May 12 for "Vaporizer and ion source" (New Hampshire, Massachusetts Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,888, issued on May 12, was assigned to NISSIN ION EQUIPMENT Co. LTD.. "Vaporizer and ion source" was invented by George Sacco (Groveland, Ma... Read More

US Patent Issued to Tokyo Electron on May 12 for "Plasma processing method and apparatus" (Minnesota, Texas Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,889, issued on May 12, was assigned to Tokyo Electron Ltd. (Tokyo). "Plasma processing method and apparatus" was invented by Derek William B... Read More

US Patent Issued to SEMES on May 12 for "Substrate treating apparatus" (South Korean Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,890, issued on May 12, was assigned to SEMES Co. LTD. (Cheonan-si, South Korea). "Substrate treating apparatus" was invented by Jin Hee Hong... Read More

US Patent Issued to DAIHEN on May 12 for "Plasma processing apparatus" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,891, issued on May 12, was assigned to DAIHEN Corp. (Osaka, Japan). "Plasma processing apparatus" was invented by Ryoji Tamaki (Osaka, Japan... Read More

• ««
• «
• 165445
• 165446
• 165447
• 165448
• 165449
• 165450
• 165451
• 165452
• 165453
• 165454
• »
• »»