ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,884, issued on May 12, was assigned to FEI COMPANY (Hillsboro, Ore.).
"Method and scanning transmission charged-particle microscope" was invented by Eric Bosch (Eindhoven, Netherlands) and Ivan Lazic (Eindhoven, Netherlands).
According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method of processing image data according to the present disclosure comprises: receiving the image data, wherein the image data is scanning transmission charged-particle microscope (STCPM) image data representing a STCPM scan obtained at a first focus depth; and processing a system of equations expressing the image data as a sum of contributions from a plurality...