US Patent Issued to FEI on May 12 for "Sample carrier for use in a charged particle microscope, and a method of using such a sample carrier in a charged particle microscope" (Czech Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,882, issued on May 12, was assigned to FEI Co. (Hillsboro, Ore.).

"Sample carrier for use in a charged particle microscope, and a method of using such a sample carrier in a charged particle microscope" was invented by Frantisek Vaske (Brno, Czech Republic) and Jakub Kuba (Brno, Czech Republic).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure relates to a method of preparing a sample in a charged particle microscope. The method comprises the steps of providing a sample carrier having a mechanical support contour and a grid member connected thereto. The method comprises the step of connecting said sample carrier to a mechanical stage device...