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US Patent Issued on Oct. 20 for "Line fault detection method, system, device, and computer-readable storage medium" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,871, issued on Oct. 20. "Line fault detection method, system, device, and computer-readable storage medium" was invented by Hongchun Shu (K... Read More


US Patent Issued to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE on Oct. 20 for "Series arc-fault detection apparatus and method" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,872, issued on Oct. 20, was assigned to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE (Daejeon, South Korea). "Series arc-fault det... Read More


US Patent Issued to King Yuan Electronics on Oct. 20 for "Cover opening and closing equipment" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,873, issued on Oct. 20, was assigned to King Yuan Electronics Co. Ltd. (Hsin-Chu, Taiwan). "Cover opening and closing equipment" was invent... Read More


US Patent Issued to COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES on Oct. 20 for "Device and method for characterizing the current collapse of GaN transistors" (French Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,874, issued on Oct. 20, was assigned to COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES (Paris). "Device and method for char... Read More


US Patent Issued to Apple on Oct. 20 for "Electrical testing for panel characterization and defect screening" (California Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,875, issued on Oct. 20, was assigned to Apple Inc. (Cupertino, Calif.). "Electrical testing for panel characterization and defect screening... Read More


US Patent Issued on Oct. 20 for "Load pull tuner with integrated on-wafer planarity control" (Canadian Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,876, issued on Oct. 20. "Load pull tuner with integrated on-wafer planarity control" was invented by Christos Tsironis (Kirkland, Canada). ... Read More


US Patent Issued to GLOBAL UNICHIP, TAIWAN SEMICONDUCTOR MANUFACTURING on Oct. 20 for "Method for estimating performance values of chips, computing system, and non-transitory computer-readable storage medium" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,877, issued on Oct. 20, was assigned to GLOBAL UNICHIP Corp. (Hsinchu City, Taiwan) and TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsi... Read More


US Patent Issued to Micron Technology on Oct. 20 for "Device cooling enclosure and adapter for housing devices of different widths" (California Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,878, issued on Oct. 20, was assigned to Micron Technology Inc. (Boise, Idaho). "Device cooling enclosure and adapter for housing devices of... Read More


US Patent Issued to NVIDIA on Oct. 20 for "Thermal measurement for complex thermal stack up products" (California Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,879, issued on Oct. 20, was assigned to NVIDIA Corp. (Santa Clara, Calif.). "Thermal measurement for complex thermal stack up products" was... Read More


US Patent Issued to ADVANTEST on Oct. 20 for "Temperature adjusting system, controller, electronic device handling apparatus, tester, and electronic device testing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,880, issued on Oct. 20, was assigned to ADVANTEST Corp. (Tokyo). "Temperature adjusting system, controller, electronic device handling appa... Read More