US Patent Issued to ADVANTEST on Oct. 20 for "Temperature adjusting system, controller, electronic device handling apparatus, tester, and electronic device testing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,880, issued on Oct. 20, was assigned to ADVANTEST Corp. (Tokyo).

"Temperature adjusting system, controller, electronic device handling apparatus, tester, and electronic device testing apparatus" was invented by Yuya Yamada (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A temperature adjusting system includes a temperature adjuster that adjusts a temperature of a device under test (DUT) and a first acquirer that acquires a first digital signal and outputs a second digital signal. The first digital signal is output from a first temperature detecting circuit in the DUT and indicates an internal temperature of the DUT. The temperature adjusting s...