US Patent Issued to Apple on Oct. 20 for "Electrical testing for panel characterization and defect screening" (California Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,875, issued on Oct. 20, was assigned to Apple Inc. (Cupertino, Calif.).

"Electrical testing for panel characterization and defect screening" was invented by Xuebei Yang (Fremont, Calif.), Chung-Lun E Hsu (San Jose, Calif.), Cheuk Chi Lo (Belmont, Calif.), Hasan Akyol (Los Altos, Calif.), Yingkan Lin (San Jose, Calif.), John T Wetherell (San Jose, Calif.) and Han Zhao (Santa Clara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are provided for electrical testing to supplement or replace optical testing of an electronic display. Internal testing circuitry that includes analog front end (AFE) and analog-to-digital converter ...