ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,692, issued on Aug. 18, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Optical proximity correction method and phot... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,693, issued on Aug. 18, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Photomask including line pattern monitoring ... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,694, issued on Aug. 18, was assigned to D2S INC. (San Jose, Calif.). "Mask optimization for first layer that accounts for other layers" was... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,695, issued on Aug. 18, was assigned to CANON K.K. (Tokyo). "Film formation apparatus, film formation method, imprinting apparatus, planari... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,696, issued on Aug. 18, was assigned to FUJIFILM Corp. (Tokyo). "Flexographic printing plate precursor" was invented by Kenji Kano (Haibara... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,697, issued on Aug. 18, was assigned to WUHAN XINXIN SEMICONDUCTOR MANUFACTURING Co. LTD. (Wuhan, China). "Overlay mark, overlay error meas... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,698, issued on Aug. 18, was assigned to KLA Corp. (Milpitas, Calif.). "Methods for measurement of rAIM" was invented by Yoel Feler (Haifa, ... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,699, issued on Aug. 18, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Methods of mitigating crosstalk in metrology image... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,700, issued on Aug. 18, was assigned to CANON K.K. (Tokyo). "Substrate holding apparatus, substrate processing apparatus, separation method... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,701, issued on Aug. 18, was assigned to STEK Co. LTD. (New Taipei City, Taiwan). "Mask inspection apparatus" was invented by Ming-Sheng Che... Read More