ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,332, issued on Sept. 15, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea). "Memory device with improved threshold v... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,333, issued on Sept. 15, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea). "Memory device for performing channel precharge operati... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,334, issued on Sept. 15, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China). "Memory devices, memory systems, and control... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,335, issued on Sept. 15, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Memory device and method of performing a verify operatio... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,336, issued on Sept. 15, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Shift registers" was invented by Seong Jin Yun (Icheon-s... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,337, issued on Sept. 15, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea). "Memory having latch circuit and memory system" was inv... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,338, issued on Sept. 15, was assigned to Micron Technology Inc. (Boise, Idaho). "Interrupting a memory built-in self-test" was invented by... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,339, issued on Sept. 15, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Integrated circuit and method... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,340, issued on Sept. 15, was assigned to Winbond Electronics Corp. (Taichung City, Taiwan). "Flash memory and testing method thereof" was ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,341, issued on Sept. 15, was assigned to Micron Technology Inc. (Boise, Idaho). "Cycling replacement blocks based on a die wafer location"... Read More