ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,753, issued on Sept. 8, was assigned to mi2-factory GMBH (Jena, Germany). "Energy filter assembly for ion implantation system with at least... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,754, issued on Sept. 8, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Electron-optical assembly comprising electromagnet... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,755, issued on Sept. 8, was assigned to Hitachi High-Tech Science Corp. (Tokyo). "Focused ion beam device" was invented by Koji Nagahara (T... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,756, issued on Sept. 8, was assigned to FORSCHUNGSZENTRUM JULICH GMBH (Julich, Germany). "Magnetization device for an electron microscope a... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,757, issued on Sept. 8, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany). "Device and method for preparing microscopic samples vi... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,758, issued on Sept. 8, was assigned to JIANGSU LEUVEN INSTRUMENTS Co. LTD. (Xuzhou, China). "Ion beam etching machine and lower electrode ... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,759, issued on Sept. 8, was assigned to NuFlare Technology Inc. (Yokohama, Japan). "Beam detector, multi-charged-particle-beam irradiation ... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,760, issued on Sept. 8, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Spin-polarized scanning electron microscope" was invented by Teru... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,762, issued on Sept. 8, was assigned to Tokyo Electron Ltd. (Tokyo). "Method for plasma processing" was invented by Justin Moses (Austin, T... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,763, issued on Sept. 8, was assigned to Tokyo Electron Ltd. (Tokyo). "Plasma processing system, assistance device, assistance method, and a... Read More