US Patent Issued to HITACHI HIGH-TECH on Sept. 8 for "Spin-polarized scanning electron microscope" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,760, issued on Sept. 8, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Spin-polarized scanning electron microscope" was invented by Teruo Kohashi (Tokyo), Hideo Morishita (Tokyo), Takashi Ohshima (Tokyo) and Makoto Kuwahara (Nagoya, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a spin-polarized scanning electron microscope capable of improving an SNR of a detected signal. The spin-polarized scanning electron microscope includes: a spin-polarized electron source configured to irradiate a sample with a spin-polarized electron beam that is an electron beam whose spin is deflected in a specific direction; a scanning unit configured...