ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,448, issued on Sept. 8, was assigned to LAM RESEARCH AG (Villach, Austria). "Apparatus for processing a wafer" was invented by Michael Brug... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,449, issued on Sept. 8, was assigned to VAT Holding AG (Haag, Switzerland). "Pin lifting device" was invented by Michael Dur (Hohenweiler, ... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,450, issued on Sept. 8, was assigned to Tokyo Electron Ltd. (Tokyo). "Multi-material chuck" was invented by Christopher Netzband (Albany, N... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,451, issued on Sept. 8, was assigned to SCREEN Holdings Co. Ltd. (Kyoto, Japan). "Substrate processing apparatus" was invented by Shinichi ... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,452, issued on Sept. 8, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Cassette structures and related methods for batch pr... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,453, issued on Sept. 8, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Susceptor assembly thermal break and methods for coo... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,454, issued on Sept. 8, was assigned to United Semiconductor (Xiamen) Co. Ltd. (Xiamen, China). "Method for detecting back surface of wafer... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,455, issued on Sept. 8, was assigned to Yamaha Robotics Co. Ltd. (Tokyo). "Inspection device, mounting apparatus, inspection method, and no... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,456, issued on Sept. 8, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan). "Manufacturing method, inspection method, and inspecti... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,457, issued on Sept. 8, was assigned to Tokyo Electron Ltd. (Tokyo). "Systems and methods that use infrared (IR) spectroscopy to monitor pr... Read More