ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,733,455, issued on Sept. 8, was assigned to Yamaha Robotics Co. Ltd. (Tokyo).

"Inspection device, mounting apparatus, inspection method, and non-transitory computer readable recording medium" was invented by Makoto Takahashi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection device includes: a measurement part, measuring a reference position of a mounting section before mounting of a semiconductor chip, a reference position of a plurality of peripheral sections located around the mounting section, and a position of the semiconductor chip after mounting; and an inspection part, inspecting a relative position of the semiconductor chip wit...