ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,988, issued on July 21, was assigned to Schneider Electric (China) Co. Ltd. (Beijing). "Switch" was invented by Xiaoqiang Li (Shanghai) and... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,989, issued on July 21, was assigned to BYD Co. Ltd. (Shenzhen, China). "Relay" was invented by Jiakun Huang (Shenzhen, China), Tao Lu (She... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,990, issued on July 21, was assigned to METAWATER Co. Ltd. (Tokyo). "Ozone-generating apparatus" was invented by Ryutaro Takahashi (Chiyoda... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,992, issued on July 21, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Electron beam application device" was invented by Takashi Ohshima... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,993, issued on July 21, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Multiple electron beam optics" was invented by Al... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,994, issued on July 21, was assigned to Hitachi High-Tech Corp. (Tokyo). "Stage device, and charged particle beam device" was invented by M... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,995, issued on July 21, was assigned to Institute of Biophysics, Chinese Academy of Sciences (Beijing). "Method of processing ion beam base... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,996, issued on July 21, was assigned to FEI COMPANY (Hillsboro, Ore.). "System for sensor protection in electron imaging applications" was ... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,997, issued on July 21, was assigned to DOCTOR X WORKS BV (NL/NL) (Eindhoven, Netherlands). "Microwave synchronisation system" was invented... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,998, issued on July 21, was assigned to D2S Inc. (San Jose, Calif.). "Method and system for determining a charged particle beam exposure fo... Read More