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US Patent Issued to Applied Materials Israel on July 21 for "Multiple electron beam optics" (Israeli Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,993, issued on July 21, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Multiple electron beam optics" was invented by Al... Read More


US Patent Issued to Hitachi High-Tech on July 21 for "Stage device, and charged particle beam device" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,994, issued on July 21, was assigned to Hitachi High-Tech Corp. (Tokyo). "Stage device, and charged particle beam device" was invented by M... Read More


US Patent Issued to Institute of Biophysics, Chinese Academy of Sciences on July 21 for "Method of processing ion beam based on optical microscopy imaging" (Chinese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,995, issued on July 21, was assigned to Institute of Biophysics, Chinese Academy of Sciences (Beijing). "Method of processing ion beam base... Read More


US Patent Issued to FEI on July 21 for "System for sensor protection in electron imaging applications" (Dutch Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,996, issued on July 21, was assigned to FEI COMPANY (Hillsboro, Ore.). "System for sensor protection in electron imaging applications" was ... Read More


US Patent Issued to DOCTOR X WORKS BV (NL/NL) on July 21 for "Microwave synchronisation system" (Dutch Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,997, issued on July 21, was assigned to DOCTOR X WORKS BV (NL/NL) (Eindhoven, Netherlands). "Microwave synchronisation system" was invented... Read More


US Patent Issued to D2S on July 21 for "Method and system for determining a charged particle beam exposure for a local pattern density" (California Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,998, issued on July 21, was assigned to D2S Inc. (San Jose, Calif.). "Method and system for determining a charged particle beam exposure fo... Read More


US Patent Issued to Applied Materials on July 21 for "Symmetric antenna arrays for high density plasma enhanced process chamber" (South Korean, American Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,999, issued on July 21, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Symmetric antenna arrays for high density plasma enh... Read More


US Patent Issued to Semes on July 21 for "Substrate processing apparatus" (South Korean Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,000, issued on July 21, was assigned to Semes Co. Ltd. (Cheonan-si, South Korea). "Substrate processing apparatus" was invented by Sangjeon... Read More


US Patent Issued to Tokyo Electron on July 21 for "Plasma potential adjustment circuit" (American, Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,001, issued on July 21, was assigned to Tokyo Electron Ltd. (Tokyo). "Plasma potential adjustment circuit" was invented by Qiang Wang (Aust... Read More


US Patent Issued to Tokyo Electron on July 21 for "Plasma processing apparatus, power source system, and plasma processing method" (Taiwanese Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,002, issued on July 21, was assigned to Tokyo Electron Ltd. (Tokyo). "Plasma processing apparatus, power source system, and plasma processi... Read More