US Patent Issued to Tokyo Electron on June 30 for "Substrate analysis system, substrate analysis method, and recording medium" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,569, issued on June 30, was assigned to Tokyo Electron Ltd. (Tokyo). "Substrate analysis system, substrate analysis method, and recording m... Read More

US Patent Issued to Carl Zeiss SMT on June 30 for "3D volume inspection method and method of configuring of a 3D volume inspection method" (German, American Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,570, issued on June 30, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "3D volume inspection method and method of configuring o... Read More

US Patent Issued to Mitsubishi Electric Research Laboratories on June 30 for "System and method for tomographic imaging" (Massachusetts Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,571, issued on June 30, was assigned to Mitsubishi Electric Research Laboratories Inc. (Cambridge, Mass.). "System and method for tomograph... Read More

US Patent Issued to BEIJING BOE TECHNOLOGY DEVELOPMENT, BOE TECHNOLOGY GROUP on June 30 for "Image recognition method and system with improved accuracy of recognizing defect, and training method and an electronic device" (Chinese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,572, issued on June 30, was assigned to BEIJING BOE TECHNOLOGY DEVELOPMENT Co. LTD. (Beijing) and BOE TECHNOLOGY GROUP Co. LTD. (Beijing). ... Read More

US Patent Issued to SAMSUNG SDI, NSYS on June 30 for "System for finding black spots in a separator from a rechargeable battery cell" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,573, issued on June 30, was assigned to SAMSUNG SDI Co. LTD. (Yongin-si, South Korea) and NSYS Corp.. "System for finding black spots in a ... Read More

US Patent Issued to SK On on June 30 for "Apparatus and method for predicting weld quality" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,574, issued on June 30, was assigned to SK On Co. Ltd. (Seoul, South Korea). "Apparatus and method for predicting weld quality" was invente... Read More

US Patent Issued to ASML Netherlands on June 30 for "Patterning parameter determination using a charged particle inspection system" (Oregon Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,575, issued on June 30, was assigned to ASML Netherlands B.V. (Veldoven, Netherlands). "Patterning parameter determination using a charged ... Read More

US Patent Issued to INTER X on June 30 for "AI-based apparatus and method for detecting a defect of a product" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,576, issued on June 30, was assigned to INTER X Co. LTD. (Ulsan, South Korea). "AI-based apparatus and method for detecting a defect of a p... Read More

US Patent Issued to NEC on June 30 for "Video management apparatus, video management method, and program" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,577, issued on June 30, was assigned to NEC Corp. (Tokyo). "Video management apparatus, video management method, and program" was invented ... Read More

US Patent Issued to Siemens Industry Software on June 30 for "Layout-based wafer defect identification and classification using separately generated predicted images and predicted layout designs" (California Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,578, issued on June 30, was assigned to Siemens Industry Software Inc. (Plano, Texas). "Layout-based wafer defect identification and classi... Read More

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