US Patent Issued to INTER X on June 30 for "AI-based apparatus and method for detecting a defect of a product" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,576, issued on June 30, was assigned to INTER X Co. LTD. (Ulsan, South Korea).

"AI-based apparatus and method for detecting a defect of a product" was invented by Jung Ywn Park (Ulsan, South Korea), Ha Il Jung (Ulsan, South Korea) and Jeong Hyun Park (Ulsan, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is an AI-based apparatus for detecting a defect of a product. The AI-based apparatus includes: a sensor unit which photographs a product to generate image data and measures at least one of a color, a saturation, a brightness, a transparency, and a reflectance of the product; and a detection unit which detects a defect on the pr...