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US Patent Issued to Siemens Industry on Sept. 15 for "Active arc fault circuit interrupters with solid-state components" (New York Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,437, issued on Sept. 15, was assigned to Siemens Industry Inc. (Alpharetta, Ga.). "Active arc fault circuit interrupters with solid-state ... Read More


US Patent Issued to Chengli Li on Sept. 15 for "Ground fault circuit interrupter device and related electrical connection devices and electrical appliances" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,438, issued on Sept. 15, was assigned to Chengli Li (Suzhou, China). "Ground fault circuit interrupter device and related electrical conne... Read More


US Patent Issued to DEXERIALS on Sept. 15 for "Protective element" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,439, issued on Sept. 15, was assigned to DEXERIALS Corp. (Tochigi, Japan). "Protective element" was invented by Manabu Saito (Shimotsuke, ... Read More


US Patent Issued to Moxtek on Sept. 15 for "X-ray tube with stable electron beam" (Utah Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,440, issued on Sept. 15, was assigned to Moxtek Inc. (Orem, Utah). "X-ray tube with stable electron beam" was invented by Kasey Otho Green... Read More


US Patent Issued to Photo electron Soul on Sept. 15 for "Electron beam applicator and creation method of detection data in electron beam applicator" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,441, issued on Sept. 15, was assigned to Photo electron Soul Inc. (Nagoya, Japan). "Electron beam applicator and creation method of detect... Read More


US Patent Issued to Hitachi High-Tech on Sept. 15 for "Charged particle beam device and specimen observation method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,442, issued on Sept. 15, was assigned to Hitachi High-Tech Corp. (Tokyo). "Charged particle beam device and specimen observation method" w... Read More


US Patent Issued to FEI on Sept. 15 for "Hybrid background extraction in electron holography" (Oregon Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,444, issued on Sept. 15, was assigned to FEI COMPANY (Hillsboro, Ore.). "Hybrid background extraction in electron holography" was invented... Read More


US Patent Issued to ASML Netherlands on Sept. 15 for "Beam position displacement correction in charged particle inspection" (Dutch, Belgian, American Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,445, issued on Sept. 15, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Beam position displacement correction in charged... Read More


US Patent Issued to FEI on Sept. 15 for "Laser thermal epitaxy in a charged particle microscope" (Dutch Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,446, issued on Sept. 15, was assigned to FEI Co. (Hillsboro, Ore.). "Laser thermal epitaxy in a charged particle microscope" was invented ... Read More


US Patent Issued to Hitachi High-Tech on Sept. 15 for "Vacuum processing device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,447, issued on Sept. 15, was assigned to Hitachi High-Tech Corp. (Tokyo). "Vacuum processing device" was invented by Akito Tanokuchi (Toky... Read More