ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,543, issued on April 7, was assigned to JFE STEEL Corp. (Tokyo). "Steel-sheet non-plating defect prediction method, steel-sheet defect redu... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,544, issued on April 7, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea). "Deposition apparatus" was invented by Junhyeu... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,545, issued on April 7, was assigned to First Solar Inc. (Phoenix). "Methods for perovskite device processing by vapor transport deposition... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,546, issued on April 7, was assigned to PUSAN NATIONAL UNIVERSITY INDUSTRY-UNIVERSITY COOPERATION FOUNDATION (Busan, South Korea). "Method ... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,548, issued on April 7, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Doped nickel oxide target and prepar... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,549, issued on April 7, was assigned to VIAVI SOLUTIONS INC. (Chandler, Ariz.). "Optical filter including a high refractive index material"... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,550, issued on April 7, was assigned to EVATEC AG (Trubbach, Switzerland). "Vacuum layer deposition apparatus and method of depositing a la... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,551, issued on April 7, was assigned to THE SWATCH GROUP RESEARCH AND DEVELOPMENT LTD (Marin, Switzerland). "Method for the surface treatme... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,552, issued on April 7, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Module for flipping substrates in vacuum" was invent... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,595,553, issued on April 7, was assigned to ANGSTROM ENGINEERING INC. (Kitchener, Canada). "System and method for controlling film thickness, a... Read More