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US Patent Issued to Tokyo Electron on Aug. 11 for "Point of use solvent mixing for film removal" (New York Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,785, issued on Aug. 11, was assigned to Tokyo Electron Ltd. (Tokyo). "Point of use solvent mixing for film removal" was invented by Lior Hu... और पढ़ें


US Patent Issued to XEIKON PREPRESS on Aug. 11 for "Apparatus and method for treating and transporting a relief printing plate precursor" (Belgian Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,786, issued on Aug. 11, was assigned to XEIKON PREPRESS N.V. (Ypres, Belgium). "Apparatus and method for treating and transporting a relief... और पढ़ें


US Patent Issued to KLA on Aug. 11 for "Single-cell scatterometry overlay with sensitivity calibration" (Israeli Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,787, issued on Aug. 11, was assigned to KLA Corp. (Milpitas, Calif.). "Single-cell scatterometry overlay with sensitivity calibration" was ... और पढ़ें


US Patent Issued to KLA on Aug. 11 for "Parallax method for a single-cell diffraction based measurement of misregistration" (Israeli Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,788, issued on Aug. 11, was assigned to KLA Corp. (Milpitas, Calif.). "Parallax method for a single-cell diffraction based measurement of m... और पढ़ें


US Patent Issued to KLA on Aug. 11 for "Flexible measurement models for model based measurements of semiconductor structures" (Chinese, American Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,789, issued on Aug. 11, was assigned to KLA Corp. (Milpitas, Calif.). "Flexible measurement models for model based measurements of semicond... और पढ़ें


US Patent Issued to KLA on Aug. 11 for "System and method for determining overlay measurement of a scanning target" (Israeli, American Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,790, issued on Aug. 11, was assigned to KLA Corp. (Milpitas, Calif.). "System and method for determining overlay measurement of a scanning ... और पढ़ें


US Patent Issued to Orbotech on Aug. 11 for "Vertical motion axis for imaging optical head" (Israeli Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,791, issued on Aug. 11, was assigned to Orbotech Ltd. (Yavne, Israel). "Vertical motion axis for imaging optical head" was invented by Tal ... और पढ़ें


US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Aug. 11 for "Mitigating long-term energy decay of laser devices" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,792, issued on Aug. 11, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Mitigating long-term energy dec... और पढ़ें


US Patent Issued to Tokyo Electron on Aug. 11 for "Processing liquid supply apparatus and processing liquid supply method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,793, issued on Aug. 11, was assigned to Tokyo Electron Ltd. (Tokyo). "Processing liquid supply apparatus and processing liquid supply metho... और पढ़ें


US Patent Issued to CANON on Aug. 11 for "Imprinting method, imprint apparatus and article manufacturing method" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,794, issued on Aug. 11, was assigned to CANON K.K. (Tokyo). "Imprinting method, imprint apparatus and article manufacturing method" was inv... और पढ़ें