US Patent Issued to Shenzhen University on July 28 for "Apparatus and method for measuring chlorine ions in concrete" (Chinese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,226, issued on July 28, was assigned to Shenzhen University (Shenzhen City, China). "Apparatus and method for measuring chlorine ions in co... Read More

US Patent Issued to Nissan Motor on July 28 for "Coating evaluation device and coating evaluation method" (Japanese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,227, issued on July 28, was assigned to Nissan Motor Co. Ltd. (Yokohama, Japan). "Coating evaluation device and coating evaluation method" ... Read More

US Patent Issued to General Electric on July 28 for "Electromagnetic inspection systems and methods" (Indian, American Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,228, issued on July 28, was assigned to General Electric Co. (Evendale, Ohio). "Electromagnetic inspection systems and methods" was invente... Read More

US Patent Issued to SAMSUNG DISPLAY on July 28 for "Inspection apparatus" (South Korean Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,229, issued on July 28, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea). "Inspection apparatus" was invented by Akifumi... Read More

US Patent Issued to Canon on July 28 for "Image processing apparatus, image processing method, and non-transitory computer-readable medium" (Japanese Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,230, issued on July 28, was assigned to Canon K.K. (Tokyo). "Image processing apparatus, image processing method, and non-transitory comput... Read More

US Patent Issued to Mitsubishi Electric on July 28 for "Appearance inspection method for goods" (Japanese Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,231, issued on July 28, was assigned to Mitsubishi Electric Corp. (Tokyo). "Appearance inspection method for goods" was invented by Motoyos... Read More

US Patent Issued to LASERTEC on July 28 for "Light source apparatus, inspection apparatus, exposure apparatus, light source control method, inspection method, and exposure method" (Japanese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,232, issued on July 28, was assigned to LASERTEC Corp. (Yokohama, Japan). "Light source apparatus, inspection apparatus, exposure apparatus... Read More

US Patent Issued to Hewlett-Packard Development on July 28 for "Pixel deviations" (Colorado, California Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,233, issued on July 28, was assigned to Hewlett-Packard Development Co. LP (Spring, Texas). "Pixel deviations" was invented by Fred Charles... Read More

US Patent Issued to SAMSUNG DISPLAY on July 28 for "Optical inspection system and optical inspection method" (South Korean Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,234, issued on July 28, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea). "Optical inspection system and optical inspect... Read More

US Patent Issued to ABB SCHWEIZ on July 28 for "Drive condition monitoring" (Finnish Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,235, issued on July 28, was assigned to ABB SCHWEIZ AG (Baden, Switzerland). "Drive condition monitoring" was invented by Teemu Tanila (Hel... Read More

• ««
• «
• 938
• 939
• 940
• 941
• 942
• 943
• 944
• 945
• 946
• 947
• »
• »»