US Patent Issued to The University of Tokyo on Nov. 3 for "Processing system, marking method, marker detected in said method, and marking program" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,378, issued on Nov. 3, was assigned to The University of Tokyo (Tokyo). "Processing system, marking method, marker detected in said method, ... Read More

US Patent Issued to TECONER on Nov. 3 for "Wind speed measurement" (Finnish Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,379, issued on Nov. 3, was assigned to TECONER OY (Helsinki). "Wind speed measurement" was invented by Pauli Nylander (Helsinki). According... Read More

US Patent Issued to Rosemount Aerospace Inc. (HSC) on Nov. 3 for "Additively manufactured strut for air data probe" (Minnesota Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,380, issued on Nov. 3, was assigned to Rosemount Aerospace Inc. (HSC) (Burnsville, Minn.). "Additively manufactured strut for air data probe... Read More

US Patent Issued to EmMea on Nov. 3 for "Emission flowmeter system" (Canadian Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,381, issued on Nov. 3, was assigned to EmMea Inc. (Calgary, Canada). "Emission flowmeter system" was invented by Willow Liu (Calgary, Canada... Read More

US Patent Issued to AAC Kaitai Technologies (Wuhan) on Nov. 3 for "Acceleration sensor" (Singaporean, Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,383, issued on Nov. 3, was assigned to AAC Kaitai Technologies (Wuhan) Co. LTD. (Wuhan, China). "Acceleration sensor" was invented by Lingch... Read More

US Patent Issued to HITACHI CONSTRUCTION MACHINERY on Nov. 3 for "Speed measurement device" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,384, issued on Nov. 3, was assigned to HITACHI CONSTRUCTION MACHINERY Co. LTD. (Tokyo). "Speed measurement device" was invented by Hiroki It... Read More

US Patent Issued to SHIMADZU on Nov. 3 for "Scanning probe microscope, information processing method, and program" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,385, issued on Nov. 3, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Scanning probe microscope, information processing method, and program... Read More

US Patent Issued to Taiwan Semiconductor Manufacturing on Nov. 3 for "Method of forming a plurality of conductive interconnect structures for circuit probe testing of an integrated circuit structure" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,386, issued on Nov. 3, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Method of forming a plurality of cond... Read More

US Patent Issued to TOKYO SEIMITSU on Nov. 3 for "Prober with falling restriction mechanism" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,387, issued on Nov. 3, was assigned to TOKYO SEIMITSU Co. LTD. (Hachioji, Japan). "Prober with falling restriction mechanism" was invented b... Read More

US Patent Issued to MPI on Nov. 3 for "Contact probe and contacting member thereof, method of manufacturing contacting member, probe system using the contacting member, method of testing unpackaged semiconductor device, tested semiconductor device and method of producing the same" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,388, issued on Nov. 3, was assigned to MPI Corp. (Chu-Pei City, Taiwan). "Contact probe and contacting member thereof, method of manufacturi... Read More

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