US Patent Issued to SHIMADZU on Nov. 3 for "Scanning probe microscope, information processing method, and program" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,385, issued on Nov. 3, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Scanning probe microscope, information processing method, and program" was invented by Hiroshi Arai (Kyoto, Japan), Hideo Nakajima (Kyoto, Japan), Shiho Moriguchi (Kyoto, Japan) and Chiharu Nakano (Fukuchiyama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scanning probe microscope is equipped with an observation device for observing a sample containing particles and an information processing device. The information processing device generates one or more observation images based on observation data acquired by observing a sample with the observation device, calculates a ...