US Patent Issued to International Business Machines on June 9 for "EMC scattering apparatus" (New York, North Carolina Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,453, issued on June 9, was assigned to International Business Machines Corp. (Armonk, N.Y.). "EMC scattering apparatus" was invented by John... Read More

US Patent Issued to GE VERNOVA INFRASTRUCTURE TECHNOLOGY on June 9 for "Systems and methods for determining a distance to a fault in a power systems network" (British Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,454, issued on June 9, was assigned to GE VERNOVA INFRASTRUCTURE TECHNOLOGY LLC (Greenville, S.C.). "Systems and methods for determining a d... Read More

US Patent Issued to FUJI ELECTRIC on June 9 for "Semiconductor device and overcurrent protection device" (Japanese Inventor)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,455, issued on June 9, was assigned to FUJI ELECTRIC Co. LTD. (Kawasaki, Japan). "Semiconductor device and overcurrent protection device" wa... Read More

US Patent Issued to Nexperia on June 9 for "Method of testing a semiconductor device as well as a corresponding testing device" (German Inventor)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,456, issued on June 9, was assigned to Nexperia B.V. (Nijmegen, Netherlands). "Method of testing a semiconductor device as well as a corresp... Read More

US Patent Issued to Canon on June 9 for "Semiconductor apparatus, image capturing apparatus, image capturing system, and moving object" (Japanese Inventor)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,457, issued on June 9, was assigned to Canon K.K. (Tokyo). "Semiconductor apparatus, image capturing apparatus, image capturing system, and ... Read More

US Patent Issued to Onto Innovation SDI on June 9 for "Wide bandgap semiconductor characterization based on capacitance characteristics acquired using corona surface charge neutralization by UV radiation pulses" (Florida Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,458, issued on June 9, was assigned to Onto Innovation SDI LLC (Tampa, Fla.). "Wide bandgap semiconductor characterization based on capacita... Read More

US Patent Issued to Intel on June 9 for "Test and repair of interconnects between chips" (Indian, Israeli, American Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,459, issued on June 9, was assigned to Intel Corp. (Santa Clara, Calif.). "Test and repair of interconnects between chips" was invented by S... Read More

US Patent Issued to TEXAS INSTRUMENTS on June 9 for "Calibration for routing resistance induced error" (Indian Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,460, issued on June 9, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Calibration for routing resistance induced error" was invented by G... Read More

US Patent Issued to Ohio State Innovation Foundation on June 9 for "Use of electromagnetic signature to determine the type of integrated circuit" (Ohio Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,461, issued on June 9, was assigned to Ohio State Innovation Foundation (Columbus, Ohio). "Use of electromagnetic signature to determine the... Read More

US Patent Issued to AEM SINGAPORE on June 9 for "Device and thermal tester for thermal testing dies of an integrated circuit" (Singaporean Inventor)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,650,462, issued on June 9, was assigned to AEM SINGAPORE PTE. LTD. (Singapore). "Device and thermal tester for thermal testing dies of an integr... Read More

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