ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,189, issued on July 7, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea). "Stack-type memory device having a leakage control block ve... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,190, issued on July 7, was assigned to Micron Technology Inc. (Boise, Idaho). "Drain-side wordline voltage boosting to reduce lateral electr... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,191, issued on July 7, was assigned to Micron Technology Inc. (Boise, Idaho). "Seeding bias control for sub-block groups in a memory device"... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,192, issued on July 7, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea). "Memory device for supporting efficient erase operation and... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,193, issued on July 7, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Non-volatile memory with adjustable erase voltage" was... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,194, issued on July 7, was assigned to Micron Technology Inc. (Boise, Idaho). "Interfaces between higher voltage and lower voltage wafers an... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,195, issued on July 7, was assigned to Kioxia Corp. (Tokyo). "Semiconductor memory device with even and odd coplanar wordlines" was invented... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,196, issued on July 7, was assigned to eMemory Technology Inc. (Hsin-Chu, Taiwan). "Level shifter" was invented by Dung Le Tan Hoang (Hsinch... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,197, issued on July 7, was assigned to SILICON MOTION INC. (Jhubei City, Taiwan). "Data storage device and control method for non-volatile m... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,198, issued on July 7, was assigned to Micron Technology Inc. (Boise, Idaho). "Alternative erase schemes for reliability-risk word lines" wa... Read More