US Patent Issued to TOYOTA JIDOSHA on April 21 for "Information processing device, non-transitory storage medium, and information processing method" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,949, issued on April 21, was assigned to TOYOTA JIDOSHA K.K. (Toyota, Japan). "Information processing device, non-transitory storage mediu... Read More

US Patent Issued to DENSO International America, DENSO on April 21 for "Systems and methods for detecting objects based on lidar data" (Michigan Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,950, issued on April 21, was assigned to DENSO International America Inc. (Southfield, Mich.) and DENSO Corp. (Kariya-city, Japan). "Syste... Read More

US Patent Issued to TOYOTA JIDOSHA on April 21 for "Method and system for generating ground truth data for machine learning of recognizer" (Japanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,951, issued on April 21, was assigned to TOYOTA JIDOSHA K.K. (Toyota, Japan). "Method and system for generating ground truth data for mach... Read More

US Patent Issued to Sandisk Technologies on April 21 for "Apparatus and methods for detecting coupling faults in non-volatile memory devices" (California Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,175, issued on April 21, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Apparatus and methods for detecting coupling fault... Read More

US Patent Issued to SUZHOU METABRAIN INTELLIGENT TECHNOLOG Y on April 21 for "Memory processing method based on a server and apparatus, processor and electronic device" (Chinese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,176, issued on April 21, was assigned to SUZHOU METABRAIN INTELLIGENT TECHNOLOG Y Co. LTD. (Suzhou, China). "Memory processing method base... Read More

US Patent Issued to NANYA TECHNOLOGY on April 21 for "Memory device and internal voltage measuring method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,177, issued on April 21, was assigned to NANYA TECHNOLOGY Corp. (New Taipei City, Taiwan). "Memory device and internal voltage measuring m... Read More

US Patent Issued to SK hynix on April 21 for "Test circuit and semiconductor memory system including the test circuit" (South Korean Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,178, issued on April 21, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Test circuit and semiconductor memory system including t... Read More

US Patent Issued to SAMSUNG ELECTRONICS on April 21 for "Methods of testing repair circuits of memory devices" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,179, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Methods of testing repair circuits of memo... Read More

US Patent Issued to PHISON ELECTRONICS on April 21 for "Data check method, memory storage device and memory control circuit unit" (Taiwanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,180, issued on April 21, was assigned to PHISON ELECTRONICS CORP. (Miaoli, Taiwan). "Data check method, memory storage device and memory c... Read More

US Patent Issued to Sandisk Technologies on April 21 for "Error handling during a memory compaction process" (Indian Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,181, issued on April 21, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Error handling during a memory compaction process"... Read More

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