US Patent Issued to SAMSUNG ELECTRONICS on April 21 for "Methods of testing repair circuits of memory devices" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,179, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Methods of testing repair circuits of memory devices" was invented by Taewon Kim (Suwon-si, South Korea), Sanghee Kang (Suwon-si, South Korea), Kiho Hyun (Suwon-si, South Korea) and Taeyun Kim (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of testing a repair circuit of a memory device. The method may include storing first addresses in a first register of the repair circuit, wherein the first register is configured to store faulty addresses during a normal operation of the memory device, and the repair circuit is configure...