US Patent Issued to SK hynix on April 21 for "Test circuit and semiconductor memory system including the test circuit" (South Korean Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,609,178, issued on April 21, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Test circuit and semiconductor memory system including the test circuit" was invented by Jong Seok Jung (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test circuit including a test core configured to set a charging current quantity as a first value and perform charging and discharging on a test node of a test target circuit during a first measurement interval and configured to change the charging current quantity from the first value to a second value and perform charging and discharging on the test node during a second measurement interval, ...