US Patent Issued to HITACHI HIGH-TECH on May 12 for "Automatic analyzer" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,155, issued on May 12, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Automatic analyzer" was invented by Tsukasa Suenari (Tokyo), Takeno... Read More

US Patent Issued to Qorvo US on May 12 for "Apparatus incorporating strain sensor for determining relative velocity, flow, or attack angle between a fluid and a body" (North Carolina Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,156, issued on May 12, was assigned to Qorvo US Inc. (Greensboro, N.C.). "Apparatus incorporating strain sensor for determining relative vel... Read More

US Patent Issued to Fernsteuergerate Kurt Oelsch on May 12 for "Anemometer with pivoting mount and integrated beacon" (German Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,157, issued on May 12, was assigned to Fernsteuergerate Kurt Oelsch GmbH (Berlin). "Anemometer with pivoting mount and integrated beacon" wa... Read More

US Patent Issued to Robert Bosch on May 12 for "Method and device for detecting state of door or window" (Chinese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,158, issued on May 12, was assigned to Robert Bosch GmbH (Stuttgart, Germany). "Method and device for detecting state of door or window" was... Read More

US Patent Issued to SEIKO EPSON on May 12 for "Physical quantity sensor and inertial measurement unit" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,159, issued on May 12, was assigned to SEIKO EPSON Corp. (Japan). "Physical quantity sensor and inertial measurement unit" was invented by K... Read More

US Patent Issued to STMicroelectronics International on May 12 for "Always-on shock and orientation detection" (Italian Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,160, issued on May 12, was assigned to STMicroelectronics International N.V. (Geneva). "Always-on shock and orientation detection" was inven... Read More

US Patent Issued to NTT on May 12 for "Semiconductor module inspection device" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,161, issued on May 12, was assigned to NTT Inc. (Tokyo). "Semiconductor module inspection device" was invented by Masayuki Takahashi (Musash... Read More

US Patent Issued to WinWay Technology on May 12 for "Test socket" (Taiwanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,162, issued on May 12, was assigned to WinWay Technology Co. Ltd. (Kaohsiung City, Taiwan). "Test socket" was invented by Po-Han Yeh (Kaohsi... Read More

US Patent Issued to CHUNGHWA PRECISION TEST TECH. on May 12 for "Cantilever probe card device and climb-restricting probe" (Taiwanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,163, issued on May 12, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Cantilever probe card device and clim... Read More

US Patent Issued to STAR TECHNOLOGIES on May 12 for "Probe device, probe system including the probe device and operating method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,164, issued on May 12, was assigned to STAR TECHNOLOGIES INC. (Hsinchu City, Taiwan). "Probe device, probe system including the probe device... Read More

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