ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,162, issued on May 12, was assigned to WinWay Technology Co. Ltd. (Kaohsiung City, Taiwan).
"Test socket" was invented by Po-Han Yeh (Kaohsiung City, Taiwan) and Chia-Pin Sun (Kaohsiung City, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test socket is provided and includes a base with a first surface, a second surface opposing the first surface and through holes, a conductive elastic sheet located on the first surface, and a plurality of elastic metal members with first contact ends facing toward the conductive elastic sheet. The first contact ends include bumps suitable for inserting into the conductive elastic sheet, and each elastic met...