US Patent Issued to CHUNGHWA PRECISION TEST TECH. on May 12 for "Cantilever probe card device and climb-restricting probe" (Taiwanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,163, issued on May 12, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan).

"Cantilever probe card device and climb-restricting probe" was invented by Hao-Yen Cheng (Taoyuan City, Taiwan), Rong-Yang Lai (Taoyuan City, Taiwan), Chao-Hui Tseng (New Taipei City, Taiwan) and Wei-Jhih Su (Taichung City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A climb-restricting probe includes an arm segment, a main segment located at one side of the arm segment, a testing segment connected to another side of the arm segment, and a climb-restricting ring. The main segment has a soldering end portion and an extending end portion resp...