ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,456, issued on June 23, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "In-situ electric field detection method and apparatu... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,457, issued on June 23, was assigned to Rockwell Automation Technologies Inc. (Mayfield Heights, Ohio). "Fault-managed power via black-chan... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,458, issued on June 23, was assigned to AMCAD ENGINEERING (Limoges, France). "Method for characterizing in pulse mode a III-V semiconductor... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,459, issued on June 23, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Test signal circuit for testing a radio frequency r... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,460, issued on June 23. "Apparatus for testing electronic devices" was invented by SeungHyeon Jeong (Chuncheon, South Korea), HunTaek Lee (... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,461, issued on June 23, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "System for thermal testing a wafer ... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,462, issued on June 23, was assigned to NXP USA Inc. (Austin, Texas). "On-chip fault detection due to malfunctions on chip pins" was invent... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,463, issued on June 23, was assigned to Tektronix Inc. (Beaverton, Ore.). "Split-path multiplexing accessory for a test and measurement ins... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,464, issued on June 23, was assigned to Rohm Co. Ltd. (Kyoto, Japan). "Semiconductor integrated circuit device and vehicle" was invented by... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,465, issued on June 23, was assigned to Tektronix Inc. (Beaverton, Ore.). "Test and measurement instrument accessory with reconfigurable pr... Read More