US Patent Issued to NXP USA on June 23 for "On-chip fault detection due to malfunctions on chip pins" (American, Indian Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,462, issued on June 23, was assigned to NXP USA Inc. (Austin, Texas).

"On-chip fault detection due to malfunctions on chip pins" was invented by Kumar Abhishek (Bee Cave, Texas), Neha Srivastava (New Delhi), Vivek Kumar Yadav (Austin, Texas), Sanjaykumar Hansrajbhai Kakasaniya (Austin, Texas) and Vikram Joshi (Austin, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A first power supply pad is configured to provide a first power supply to a power domain of the SoC in which the first power supply pad is configured to receive the first power supply from a source external to the SoC. A first signal pad is configured to receive a power ready signal ...