US Patent Issued on June 23 for "Apparatus for testing electronic devices" (South Korean Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,460, issued on June 23.

"Apparatus for testing electronic devices" was invented by SeungHyeon Jeong (Chuncheon, South Korea), HunTaek Lee (Gyeonggi-do, South Korea), BumSoo Park (Seoul, South Korea) and JiSu Lee (Incheon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for testing electronic devices comprises: a base platform; a cover plate disposed on the base platform, and defining with the base platform an array of test chambers and at least one gap separating the test chambers from each other, wherein the cover plate has at each of the test chambers a top opening for placing an electronic device within the test chamber an...