US Patent Issued to Infineon Technologies on June 23 for "Test signal circuit for testing a radio frequency receiver circuit, a semiconductor chip and a system comprising the test signal circuit" (Austrian, German Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,459, issued on June 23, was assigned to Infineon Technologies AG (Neubiberg, Germany).

"Test signal circuit for testing a radio frequency receiver circuit, a semiconductor chip and a system comprising the test signal circuit" was invented by Faisal Ahmed (Engerwitzdorf, Austria), Muhammad Furqan (Linz, Austria), Stefan Herzinger (Sauerlach, Germany) and Thomas Obermueller (Linz, Austria).

According to the abstract* released by the U.S. Patent & Trademark Office: "Test signal circuit for testing a radio frequency receiver circuit, including: a test signal generator configured to generate a baseband test signal, a modulator configured to modulate a local oscillator signal with the ...