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US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Aug. 18 for "Memory circuit with multiply-accumulate (MAC) circuit and method of operating the same" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,040, issued on Aug. 18, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Memory circuit with multiply-ac... Read More


US Patent Issued to Micron Technology on Aug. 18 for "Defect detection during erase operations" (California Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,041, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho). "Defect detection during erase operations" was invented by J... Read More


US Patent Issued to Micron Technology on Aug. 18 for "Voltage scaling based on error rate" (American, Israeli Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,042, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho). "Voltage scaling based on error rate" was invented by Leon Z... Read More


US Patent Issued to Micron Technology on Aug. 18 for "Voltage scaling based on error rate" (American, Israeli Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,043, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho). "Voltage scaling based on error rate" was invented by Leon Z... Read More


US Patent Issued to Micron Technology on Aug. 18 for "Dual-read data integrity scan in a memory sub-system" (California Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,044, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho). "Dual-read data integrity scan in a memory sub-system" was i... Read More


US Patent Issued to Sandisk Technologies on Aug. 18 for "Variable resistance for current control in nonvolatile memory arrays" (California Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,045, issued on Aug. 18, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Variable resistance for current control in nonvolati... Read More


US Patent Issued to Micron Technology on Aug. 18 for "Performing multi-plane test operation on dynamically determined block stripe" (Indian Inventor)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,046, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho). "Performing multi-plane test operation on dynamically determ... Read More


US Patent Issued to Micron Technology on Aug. 18 for "Apparatuses and methods for separate write enable for single-pass access of data, metadata, and parity information" (Idaho Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,047, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho). "Apparatuses and methods for separate write enable for singl... Read More


US Patent Issued to KIOXIA on Aug. 18 for "Efficient soft decoding of error correction code via extrinsic bit information" (Israeli, Japanese Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,048, issued on Aug. 18, was assigned to KIOXIA Corp. (Tokyo). "Efficient soft decoding of error correction code via extrinsic bit informati... Read More


US Patent Issued to YANGTZE MEMORY TECHNOLOGIES on Aug. 18 for "Memory devices using defective address information processing circuits, and operating methods, and memory systems thereof" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,049, issued on Aug. 18, was assigned to YANGTZE MEMORY TECHNOLOGIES Co. LTD. (Wuhan, China). "Memory devices using defective address inform... Read More