US Patent Issued to Micron Technology on Aug. 18 for "Performing multi-plane test operation on dynamically determined block stripe" (Indian Inventor)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,046, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho).

"Performing multi-plane test operation on dynamically determined block stripe" was invented by Maniraj Ashirwad Gnanaraj (Tamil Nadu, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various embodiments provide for performing a multi-plane test operation on a dynamically determined block stripe of a memory device, which can be part of a memory system, such as a memory sub-system."

The patent was filed on July 30, 2024, under Application No. 18/789,300.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Par...