US Patent Issued to Micron Technology on Aug. 18 for "Dual-read data integrity scan in a memory sub-system" (California Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,044, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho).

"Dual-read data integrity scan in a memory sub-system" was invented by Zhongguang Xu (San Jose, Calif.), Hanping Chen (San Jose, Calif.), Peng Zhang (Los Altos, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A processing device in a memory sub-system performs a first data integrity scan on a block of a memory device to determine a first combined reliability statistic of memory cells in the block associated with a first program level and a second program level, and performs, using a predetermined read level offset corresponding t...