US Patent Issued to Micron Technology on Aug. 18 for "Defect detection during erase operations" (California Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,041, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho).

"Defect detection during erase operations" was invented by Jun Xu (San Jose, Calif.) and Kitae Park (Cupertino, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a memory device including a memory array and processing logic, operatively coupled with the memory array, to perform operations including initiating an erase operation performed with respect to the memory array, identifying, between a pair of components of the memory array, at least one current differential indicative of at least one defect with respect to at least one failure point of the m...