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US Patent Issued to SK On on June 30 for "Apparatus and method for predicting weld quality" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,574, issued on June 30, was assigned to SK On Co. Ltd. (Seoul, South Korea). "Apparatus and method for predicting weld quality" was invente... Read More


US Patent Issued to ASML Netherlands on June 30 for "Patterning parameter determination using a charged particle inspection system" (Oregon Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,575, issued on June 30, was assigned to ASML Netherlands B.V. (Veldoven, Netherlands). "Patterning parameter determination using a charged ... Read More


US Patent Issued to INTER X on June 30 for "AI-based apparatus and method for detecting a defect of a product" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,576, issued on June 30, was assigned to INTER X Co. LTD. (Ulsan, South Korea). "AI-based apparatus and method for detecting a defect of a p... Read More


US Patent Issued to NEC on June 30 for "Video management apparatus, video management method, and program" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,577, issued on June 30, was assigned to NEC Corp. (Tokyo). "Video management apparatus, video management method, and program" was invented ... Read More


US Patent Issued to Siemens Industry Software on June 30 for "Layout-based wafer defect identification and classification using separately generated predicted images and predicted layout designs" (California Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,578, issued on June 30, was assigned to Siemens Industry Software Inc. (Plano, Texas). "Layout-based wafer defect identification and classi... Read More


US Patent Issued to SEETRUE SCREENING on June 30 for "Detection of prohibited objects concealed in an item, using image processing" (Israeli Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,579, issued on June 30, was assigned to SEETRUE SCREENING LTD (Tel Aviv, Israel). "Detection of prohibited objects concealed in an item, us... Read More


US Patent Issued to The Boeing on June 30 for "Systems, apparatuses, and methods for inspecting inner surfaces of holes using pixel-intensity analysis" (American, German Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,580, issued on June 30, was assigned to The Boeing Co. (Arlington, Va.). "Systems, apparatuses, and methods for inspecting inner surfaces o... Read More


US Patent Issued to PUSAN NATIONAL UNIVERSITY INDUSTRY-UNIVERSITY COOPERATION FOUNDATION on June 30 for "Apparatus and method for detecting defect using deep learning-based surface inspection" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,581, issued on June 30, was assigned to PUSAN NATIONAL UNIVERSITY INDUSTRY-UNIVERSITY COOPERATION FOUNDATION (Busan, South Korea). "Apparat... Read More


US Patent Issued to FUJIFILM on June 30 for "Image processing apparatus, method for operating image processing apparatus, and endoscope system for indicating an imaged area and a not-yet-imaged area of an image" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,582, issued on June 30, was assigned to FUJIFILM Corp. (Tokyo). "Image processing apparatus, method for operating image processing apparatu... Read More


US Patent Issued to GIVEN IMAGING on June 30 for "Systems and methods for polyp size estimation" (Israeli Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,583, issued on June 30, was assigned to GIVEN IMAGING LTD. (Yoqneam, Israel). "Systems and methods for polyp size estimation" was invented ... Read More