ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,687, issued on Oct. 20, was assigned to Kioxia Corp. (Tokyo). "Semiconductor memory device" was invented by Xu Li (Yokohama Kanagawa, Japan... और पढ़ें
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,688, issued on Oct. 20, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Memory device performing program operation and method of o... और पढ़ें
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,689, issued on Oct. 20, was assigned to Micron Technology Inc. (Boise, Idaho). "Dynamic wordline start voltage computation" was invented by... और पढ़ें
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,690, issued on Oct. 20, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China). "Managing program operations in memory devices... और पढ़ें
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,691, issued on Oct. 20, was assigned to Winbond Electronics Corp. (Taichung City, Taiwan). "Method of erasing memory cells of flash memory ... और पढ़ें
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,692, issued on Oct. 20, was assigned to MACRONIX International Co. Ltd. (Hsinchu, Taiwan). "Extraction method of physically unclonable func... और पढ़ें
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,693, issued on Oct. 20, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Memory array programming method using bitlin... और पढ़ें
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,694, issued on Oct. 20, was assigned to STMicroelectronics International N.V. (Geneva). "Circuit and method for on-chip leakage detection a... और पढ़ें
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,695, issued on Oct. 20, was assigned to Kioxia Corp. (Tokyo). "Nonvolatile semiconductor memory device and method for controlling nonvolati... और पढ़ें
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,696, issued on Oct. 20, was assigned to Micron Technology Inc. (Boise, Idaho). "Selective usage of concurrent read scans for read disturb s... और पढ़ें