US Patent Issued to Micron Technology on Oct. 20 for "Selective usage of concurrent read scans for read disturb scanning" (California, Colorado Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,696, issued on Oct. 20, was assigned to Micron Technology Inc. (Boise, Idaho).

"Selective usage of concurrent read scans for read disturb scanning" was invented by Daniel Danching Zhang (Milpitas, Calif.), John William Slattery (Boulder, Colo.) and Dongxiang Liao (Cupertino, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a memory device having planes. A processing device is operatively coupled to the memory device. The processing device initiates a background scan in response to receiving host read command(s) directed at one or more pages across the planes. The processing devices determines, based on one or more attribute va...