ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,112, issued on April 7, was assigned to NEC Corp. (Tokyo). "Inspection device, inspection method, and recording medium" was invented by Shi... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,113, issued on April 7, was assigned to Hangzhou Dianzi University (Hangzhou City, China). "Fabric defect detection method" was invented by... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,114, issued on April 7, was assigned to ACV Auctions Inc. (Buffalo, N.Y.). "Systems and techniques for vehicle inspection and condition ana... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,115, issued on April 7, was assigned to ACV Auctions Inc. (Buffalo, N.Y.). "Systems and techniques for vehicle inspection and condition ana... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,116, issued on April 7, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Automatic detection of mask defects in semic... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,117, issued on April 7, was assigned to TOYO SEIKAN Co. LTD. (Tokyo). "Method, program, apparatus, and system for abnormality detection suc... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,118, issued on April 7, was assigned to KONICA MINOLTA INC. (Tokyo). "Image inspection apparatus, image inspection method, and image inspec... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,119, issued on April 7, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea). "Operating method of electronic device inc... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,120, issued on April 7, was assigned to Seiko Epson Corp. (Tokyo). "Printed image defect discrimination device and method displaying detect... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,122, issued on April 7, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Defect detection device and method thereof" ... Read More