ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,112, issued on April 7, was assigned to NEC Corp. (Tokyo).
"Inspection device, inspection method, and recording medium" was invented by Shigeaki Namiki (Tokyo), Takuya Ogawa (Tokyo), Keiko Inoue (Tokyo), Shoji Yachida (Tokyo) and Toshinori Hosoi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "In an inspection device, a classification means classifies temporal captured images which capture a target object, into a plurality of groups. A recognition means recognizes the captured images belonging to each of the groups, and outputs a determination result for each of the groups. An integration means integrates respective determination results of the...